DocumentCode :
1667555
Title :
The influence of electric field and emission current on the configuration of nanotubes in carbon nanotubes layers
Author :
Kiselev, N.A. ; Musatov, A.L. ; Hutchison, J.L. ; Zhigalina, O.M. ; Kukovitskii, E.F. ; Artemov, V.V. ; Grigoriev, Yu.V. ; Izrael´yants, K.R. ; L´vov, S.G.
Author_Institution :
Inst. of Crystallogr., Acad. of Sci., Moscow
fYear :
2005
Firstpage :
139
Lastpage :
140
Abstract :
Carbon nanotube (NT) layers grown by CVD on Ni foil demonstrated low voltage characteristics of field electron emission: the value of the field amplification coefficient beta was in the range 1000-4000. The influence of electric field (Eav), emission current (IFE ) and exposure time on the configuration of conical-layer carbon nanotubes grown by CVD on the edge of a Ni foil has been investigated. TEM profile imaging revealed a significant concentration of NTs close to the edge surface, whereas on the NTs layers´ outer surfaces single, non-oriented NTs with open ends free of catalytic particles, were observed. After sufficient electric field application many NTs become oriented towards the anode, but one or two of them were always a few microns more extended. In-situ SEM investigation showed that below Eav = 3.2 - 3.9 V/mum, emission was achieved at the expense of originally existing free NTs ends. Configuration changes began at the higher applied fields. On the observed foil edge length (14.6 - 17.8 mum) and the edge thickness 200 mum one or two NTs extended towards the anode and probably become main emitters. On further increasing the field to Eav= 5.7 - 8 V/mum and at IFE=2times10-5 A these tubes disappeared (or essentially shortened). At Eav = 8 V/mum and higher, and at an exposure time of up to 40 min, several tens of extended NTs appeared with one or two extended significantly beyond the others. This NT configuration pattern is probably connected with electrostatic screening between the NTs. It is suggested that in the range of Eav and IFE that was investigated, a limited number of NTs were emitting and these nanotubes were constantly changing as Eav, IFE and exposure time increase
Keywords :
carbon nanotubes; chemical vapour deposition; electron field emission; scanning electron microscopy; surface topography; thin films; transmission electron microscopy; 14.6 to 17.8 mum; 200 mum; 2E-5 A; C; CVD; Ni; Ni foil; SEM; TEM profile imaging; anode; carbon nanotube layers; catalytic particles; conical-layer carbon nanotubes; electrostatic screening; emission current; exposure time; field electron emission; foil edge length; main emitters; nanotube concentration; nanotube configuration; Anodes; Carbon nanotubes; Crystalline materials; Crystallography; Electron emission; Electrostatics; Iron; Low voltage; Organic materials; Stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference, 2005. IVNC 2005. Technical Digest of the 18th International
Conference_Location :
Oxford
Print_ISBN :
0-7803-8397-4
Type :
conf
DOI :
10.1109/IVNC.2005.1619524
Filename :
1619524
Link To Document :
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