• DocumentCode
    166760
  • Title

    ESD troubleshooting using multi-level TLP

  • Author

    Yiqun Cao

  • Author_Institution
    Infineon Technol., Neubiberg, Germany
  • fYear
    2014
  • fDate
    7-12 Sept. 2014
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Standard TLP with 100ns pulse width often fail to reproduce anomalous ESD failures in products. However multi-level TLP based on the advanced hardware modifications and settings is capable of reproducing many such failures, hence significantly improving ESD troubleshooting. Representative case studies confirm the usefulness of this technique.
  • Keywords
    electrostatic discharge; failure analysis; ESD troubleshooting; advanced hardware modifications; anomalous ESD failures; multilevel TLP; time 100 ns; Electrostatic discharges; IEC; IEC standards; Pins; Resistors; Robustness; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2014 36th
  • Conference_Location
    Tucson, AZ
  • ISSN
    0739-5159
  • Type

    conf

  • Filename
    6968815
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=166760