Title :
An integrated defect tracking model for product deployment in telecom services
Author :
Hoeflin, D.A. ; Sherif, M.H.
Author_Institution :
AT&T Labs., Middletown, NJ, USA
Abstract :
This paper presents a new reliability model for the time series of failures uncovered during testing of software products. The time series can be either an S-shaped curve or a slowing exponential. The model is statistically consistent; the variance of the estimated number of failures tends to zero as the test time increases. This model can be used for managing risks in the deployment of new products that support highly reliable telecommunication services.
Keywords :
DP industry; program testing; risk management; software fault tolerance; telecommunication services; time series; S-shaped curve; integrated defect tracking model; product deployment; reliability model; risk management; slowing exponential; software products; telecommunication services reliability; time series; Cost function; Environmental economics; Laboratories; Quality management; Risk management; Software quality; Software reliability; Software testing; System testing; Telecommunication services;
Conference_Titel :
Computers and Communications, 2005. ISCC 2005. Proceedings. 10th IEEE Symposium on
Print_ISBN :
0-7695-2373-0
DOI :
10.1109/ISCC.2005.29
