1667746

IN-PROCESS INSPECTION TECHNIQUE FOR ACTIVE-MATRIX LCD PANELS

Kido, Takashi

1992

795

Active matrix liquid crystal displays; Computer displays; Electrooptic modulators; Inspection; Liquid crystal displays; Optical refraction; Optical sensors; Optical variables control; Reflectivity; Testing;

English

ieee

Test Conference, 1992. Proceedings., International

1089-3539

0-7803-0760-7

conf

10.1109/TEST.1992.527902

527902