Title :
Electron emission mechanism of diamond characterised by combined XPS/UPS/FES
Author :
Yamaguchi, H. ; Saito, I. ; Okamura, H. ; Yamada, T. ; Kudo, M. ; Pate, B.B. ; Okano, K.
Author_Institution :
Dept. of Phys., Int. Christian Univ., Tokyo, Japan
Abstract :
In this paper, the electron emission characteristics of diamond was clarified using combined X-ray photoelectron spectroscopy (XPS)/ultraviolet photoelectron spectroscopy (UPS)/field emission spectroscopy (FES). Correlation between surface termination obtained by XPS, electron affinity estimated by UPS, and energy distribution of field emitted electron by FES, provided distinguished information on the origin of emitted electrons. The results showed that the field emitted electrons originated from the gap, approximately ∼ 1 eV above the valence band maximum (VBM).
Keywords :
X-ray photoelectron spectra; diamond; electron affinity; electron field emission; ultraviolet photoelectron spectra; C; UPS; X-ray photoelectron spectroscopy; XPS; diamond; electron affinity; electron emission; energy distribution; field emission spectroscopy; surface termination; ultraviolet photoelectron spectroscopy; valence band maximum; Apertures; Cathodes; Electron emission; Energy measurement; Helium; Lighting; Nickel; Spectroscopy; Ultraviolet sources; Uninterruptible power systems;
Conference_Titel :
Vacuum Nanoelectronics Conference, 2005. IVNC 2005. Technical Digest of the 18th International
Print_ISBN :
0-7803-8397-4
DOI :
10.1109/IVNC.2005.1619535
