• DocumentCode
    1667822
  • Title

    A Flexible Data-Driven Approach for Execution Trace Filtering

  • Author

    Kouame, Kadjo ; Ezzati-Jivan, Naser ; Dagenais, Michel R.

  • Author_Institution
    Ecole Polytech. Montreal, Montreal, QC, Canada
  • fYear
    2015
  • Firstpage
    698
  • Lastpage
    703
  • Abstract
    Execution traces are frequently used to study system run-time behavior and to detect problems. However, the huge amount of data in an execution trace may complexify its analysis. Moreover, users are not usually interested in all events of a trace, hence the need for a proper filtering approach. Filtering is used to generate an enhanced trace, with a reduced size and complexity, that is easier to analyse. The approach described in this paper allows to define custom filtering patterns, declaratively in XML, to concentrate the analysis on the most important and interesting events. The filtering scenarios include syntaxes to describe various analysis patterns using finite state machines. The patterns range from very simple event filtering to complex multi-level event abstraction, covering various types of synthetic behaviours that can be captured from execution trace data. The paper provides the details on this data-driven filtering approach and some interesting use cases for the trace events generated by the LTTng Linux kernel tracer.
  • Keywords
    XML; computational complexity; finite state machines; program diagnostics; system monitoring; LTTng Linux kernel tracer; XML; analysis patterns; complexity reduction; custom filtering pattern; enhanced trace generation; event filtering; execution trace data; execution trace filtering; finite state machines; flexible data-driven approach; multilevel event abstraction; system run-time behavior; Complexity theory; Data models; Kernel; Pattern matching; Servers; Syntactics; XML; Data Filtering; LTTng; Performance analysis; Trace Analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Big Data (BigData Congress), 2015 IEEE International Congress on
  • Conference_Location
    New York, NY
  • Print_ISBN
    978-1-4673-7277-0
  • Type

    conf

  • DOI
    10.1109/BigDataCongress.2015.112
  • Filename
    7207296