• DocumentCode
    166790
  • Title

    A non-typical latch-up event on HV ESD protection

  • Author

    Shih-Yu Wang ; Hao-Chan Huang ; Chieh-Wei He ; Yao-Wen Chang ; Tao-Cheng Lu ; Kuang-Chao Chen ; Chih-Yuan Lu

  • Author_Institution
    Macronix Int. Co., Ltd., Hsinchu, Taiwan
  • fYear
    2014
  • fDate
    7-12 Sept. 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    An unexpected non-typical latch-up phenomenon from HV pad instead of power supply is discovered. Although there are double guard rings and the spacing between anode and cathode of SCR is long, the holding voltage is still extremely low. The key factors of the failed case are well studied by TCAD and solution is proposed.
  • Keywords
    anodes; cathodes; electrostatic discharge; technology CAD (electronics); thyristors; HV ESD protection; SCR; TCAD; anode; cathode; latch-up event; power supply; Capacitors; Cathodes; Electrostatic discharges; Integrated circuits; Lead; MOS devices; Thyristors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2014 36th
  • Conference_Location
    Tucson, AZ
  • ISSN
    0739-5159
  • Type

    conf

  • Filename
    6968831
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=166790