DocumentCode :
1668083
Title :
In-vacuum resonant tunneling in the nanopentode
Author :
Blackburn, A.M. ; Hasko, D.G. ; Williams, D.A.
Author_Institution :
Hitachi Cambridge Lab., Hitachi Eur. Ltd., Cambridge, UK
fYear :
2005
Firstpage :
180
Lastpage :
181
Abstract :
Nanopentode device fabrication process and predicted characteristics are presented. The fabrication process involves a combination of reaction ion etching and wet etching. The fabricated device structure makes it possible to simultaneously create an in-vacuum potential-energy barrier and well, creating a gaseous-state device similar in some respects to the solid-state resonant tunneling diode. The calculated transmission probability for electrons through the entire cathode-anode gap, in a one-dimensional approximation, shows resonances at certain gate-voltage arrangement. This strengthens the possibility of observing quantum interference effects in multiple-gate vacuum microelectronic devices.
Keywords :
anodes; cathodes; etching; nanoelectronics; quantum interference devices; resonant tunnelling; resonant tunnelling devices; vacuum microelectronics; cathode-anode gap; device fabrication; device structure; electron transmission probability; gaseous-state device; gate-voltage arrangement; in-vacuum potential-energy barrier; in-vacuum potential-energy well; in-vacuum resonant tunneling; multiple-gate vacuum microelectronic devices; nanopentode; one-dimensional approximation; quantum interference effects; reaction ion etching; solid-state resonant tunneling diode; wet etching; Diodes; Electrons; Elementary particle vacuum; Fabrication; Nanoscale devices; Probability; Resonance; Resonant tunneling devices; Solid state circuits; Wet etching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference, 2005. IVNC 2005. Technical Digest of the 18th International
Print_ISBN :
0-7803-8397-4
Type :
conf
DOI :
10.1109/IVNC.2005.1619545
Filename :
1619545
Link To Document :
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