DocumentCode :
1668167
Title :
Characterization of planar passive circuits using source method
Author :
Grayaa, Kbaled ; Aguili, Taoufik ; Bouallegue, Ammar
Author_Institution :
Lab. des Syst. et Telecommun., Ecole Nat. d´´Ingenieurs de Tunis, Tunisia
fYear :
1998
fDate :
6/20/1905 12:00:00 AM
Firstpage :
131
Lastpage :
134
Abstract :
A source method is developed for analysing STEP and GAP discontinuities in microstrip circuits. We propose to model the circuit by a rigorous method. including sources and using roof top trial functions. The roof top expansion functions approach is largely developed in the literature for complex discontinuities. Nevertheless, this approach generates a large matrix system. The numerical results obtained, giving the transmission coefficients for the STEP and GAP discontinuities, are compared with previously published data
Keywords :
Galerkin method; boundary-value problems; current density; microstrip circuits; microstrip discontinuities; passive networks; transmission line matrix methods; GAP discontinuities; Galerkin method; STEP discontinuities; boundary conditions; full wave method; impedance matrix; large matrix system; microstrip circuits; planar passive circuits; roof top trial functions; source method; transmission coefficients; Boundary conditions; Current density; Dielectric substrates; H infinity control; Impedance; Metallization; Microstrip filters; Microwave integrated circuits; Passive circuits; Transmission line matrix methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics, 1998. ICM '98. Proceedings of the Tenth International Conference on
Conference_Location :
Monastir
Print_ISBN :
0-7803-4969-5
Type :
conf
DOI :
10.1109/ICM.1998.825586
Filename :
825586
Link To Document :
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