Title :
Multi-reflection TLP: A new measurement technique for system-level automotive ESD/EMC characterization
Author :
Farbiz, F. ; Salman, A.A.
Author_Institution :
Analog ESD Team, Texas Instrum., Dallas, TX, USA
Abstract :
A new experimental setup is presented to characterize ESD protections under various stress conditions of automotive ESD/EMC qualifications. Through a software interface, this system can generate waveforms suited for specific applications. Several examples are given for characterization of device response to in-vehicle ESD/EMC events.
Keywords :
automotive electronics; electromagnetic compatibility; electrostatic discharge; ESD protections; automotive EMC qualifications; automotive ESD qualifications; in-vehicle EMC events; in-vehicle ESD events; measurement technique; multireflection TLP; software interface; stress conditions; system-level automotive; Cable shielding; Discharges (electric); Electrostatic discharges; Impedance; Power cables; Standards; Stress;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2014 36th
Conference_Location :
Tucson, AZ
