Variation-Effect Analysis of MTJ-Based Multiple-Valued Programmable Resistors

Nonvolatile multiple-valued programmable resistors based on series-parallel-connected magnetic tunnel junction (MTJ) devices are proposed for process-variation-resilient logic LSIs. Since the proposed resistors are designed using several MTJ devices of equal size, they can be fabricated without using special fabrication technologies such as that used to fabricate conventional MTJ-based multilevel resistors. In this paper, the process variation tolerance of the proposed resistors is evaluated through the Monte-Carlo analysis using a SPICE simulator with built-in MTJ device model.