• DocumentCode
    1668264
  • Title

    Bubble Razor: An architecture-independent approach to timing-error detection and correction

  • Author

    Fojtik, Matthew ; Fick, David ; Kim, Yejoong ; Pinckney, Nathaniel ; Harris, David ; Blaauw, David ; Sylvester, Dennis

  • Author_Institution
    Univ. of Michigan, Ann Arbor, MI, USA
  • fYear
    2012
  • Firstpage
    488
  • Lastpage
    490
  • Abstract
    Several methods that eliminate timing margins by detecting and correcting transient delay errors have been proposed. These Razor-style systems replace critical flip-flops with ones that detect late arriving signals, and use architectural replay to correct errors. However, none of these methods have been applied to a complete commercial processor due to their architectural invasiveness. In addition, these Razor techniques introduce significant hold time constraints that are difficult to meet given worsening timing variability. To address these two issues we propose Bubble Razor (B-Razor), which uses a novel error-detection technique based on two-phase latch timing and a local replay mechanism that can be inserted automatically in any design. The error detec tion technique breaks the dependency between minimum delay and speculation window, restoring hold-time constraints to conventional values and allowing timing speculation of up to 100% of nominal delay. The large timing specula tion makes Bubble Razor especially applicable to low-voltage designs where tim ing variation grows exponentially.
  • Keywords
    delay circuits; error correction; error detection; flip-flops; low-power electronics; timing circuits; B-Razor; architectural invasiveness; architectural replay; architecture-independent approach; bubble razor; commercial processor; error-detection technique; flip-flops; hold time constraints; hold-time constraints; late arriving signals; local replay mechanism; low-voltage designs; minimum delay; nominal delay; razor techniques; razor-style systems; speculation window; timing margins; timing speculation; timing variation; timing-error correction; timing-error detection; transient delay errors; two-phase latch timing; worsening timing variability; Clocks; Delay; Flip-flops; Latches; Logic gates; Random access memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2012 IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0193-6530
  • Print_ISBN
    978-1-4673-0376-7
  • Type

    conf

  • DOI
    10.1109/ISSCC.2012.6177103
  • Filename
    6177103