1668265

One-pass redundancy identification and removal

Abramovici, Miron ; Iyer, Mahesh A.

1995

807

Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Fault diagnosis; Logic circuits; Redundancy;

English

ieee

Test Conference, 1992. Proceedings., International

Baltimore, MD

1089-3539

0-7803-0760-7

conf

10.1109/TEST.1992.527904

527904