Title : 
Single-mask multiple lateral nanodiamond field emitter structure microfabrication technique
         
        
            Author : 
Subramanian, Kartick ; Kang, W.P. ; Davidson, J.L. ; Hofmeister, W.H. ; Choi, B.K. ; Howell, M.
         
        
            Author_Institution : 
Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN
         
        
        
        
        
            Abstract : 
An efficient microfabrication process technique developed to realize multiple lateral diamond field emitter structures on the same chip using a single mask is reported. Nanodiamond films with grain size as small as 5 nm have been realized through the process of CH4/H2/N2 MPECVD in an ASTeXreg machine with a 1.5 kW generator operating at 2.45 GHz. Arrays of lateral diode and triode geometries with inter-electrode spacing as small as 2 mum have been achieved, enabling the lateral devices to operate at a low voltage. The uniform deposition capability of nanodiamond on large areas (wafer-scale) permits batch-fabrication of these lateral emitters. The nanodiamond lateral devices are applicable to vacuum nanoelectronics, sensors, and NEMS systems
         
        
            Keywords : 
diamond; diodes; field emitter arrays; grain size; masks; nanoelectronics; nanostructured materials; plasma CVD; thin films; triodes; ASTeXreg machine; C; MPECVD; NEMS; batch-fabrication; field emitter structure microfabrication technique; grain size; inter-electrode spacing; lateral diode geometry; lateral triode geometry; nanodiamond films; sensors; single-mask multiple lateral nanodiamond field emitter structure; uniform deposition capability; vacuum nanoelectronics; Diodes; Geometry; Grain size; Low voltage; Nanoelectromechanical systems; Nanoelectronics; Nanoscale devices; Nanostructures; Sensor systems; Vacuum systems;
         
        
        
        
            Conference_Titel : 
Vacuum Nanoelectronics Conference, 2005. IVNC 2005. Technical Digest of the 18th International
         
        
            Conference_Location : 
Oxford
         
        
            Print_ISBN : 
0-7803-8397-4
         
        
        
            DOI : 
10.1109/IVNC.2005.1619554