DocumentCode :
1668322
Title :
The structured potential in the vacuum gap between two closely spaced semiconductors (dielectrics)
Author :
Il´chenko, L.G. ; Chuiko, A.A. ; Lobanov, V.V. ; Il´chenko, V.V.
Author_Institution :
Inst. of Surface Chem., Acad. of Sci., Kiev
fYear :
2004
Firstpage :
200
Lastpage :
201
Abstract :
The structured component DeltaVst(roarr) of the full potential formed between two dielectrics (semiconductors) in a small vacuum interval is calculated theoretically. The analytical expressions for DeltaVst(roarr) in the vacuum gap is calculated, using the Green´s functions of the nonlocal Poisson equation. It is shown that the structured component DeltaVst(roarr) in the case of the small separated interval L~0.3-2 nm determines the lateral changing of the potential barrier height in the vacuum gap, which can result in the origin of the ordered long-period lattice of the areas of the decrease (increase) of the full potential inside a vacuum interspace. This fact can lead to the origin of the cold field emission canals, which are stimulated by the microscopic structure of the anode surface. If the cathode-anode vacuum distance is increasing (L4rarrinfin) the origin of the emission centers at the cathode surface is connected only with the microscopic structure of its surface
Keywords :
Green´s function methods; Poisson equation; anodes; cathodes; crystal microstructure; dielectric materials; field emission; semiconductors; surface structure; Green function; anode surface; cathode surface; cathode-anode vacuum; closely spaced semiconductors; cold field emission canals; dielectrics; full potential; microscopic structure; nonlocal Poisson equation; ordered long-period lattice; potential barrier height; structured potential; vacuum gap; vacuum interval; Chemistry; Current-voltage characteristics; Dielectrics; Green´s function methods; Lattices; Microelectronics; Microscopy; Microstructure; Poisson equations; Vacuum systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference, 2005. IVNC 2005. Technical Digest of the 18th International
Conference_Location :
Oxford
Print_ISBN :
0-7803-8397-4
Type :
conf
DOI :
10.1109/IVNC.2005.1619555
Filename :
1619555
Link To Document :
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