Author :
Villa, C. ; Vimercati, D. ; Schippers, S. ; Confalonieri, E. ; Sforzin, M. ; Polizzi, S. ; Placa, M. La ; Lisi, C. ; Magnavacca, A. ; Bolandrina, E. ; Martinelli, A. ; Dima, V. ; Scavuzzo, A. ; Calandrino, B. ; Gatto, N. Del ; Scardaci, M. ; Mastroianni,
Keywords :
NOR circuits; flash memories; 1.8 V; 125 MHz; 130 nm; 256 Mbit; NOR flash memory; burst read frequency; burst-mode flash memory; fast gate-voltage-ramp constant-current-reading method; flexible read-while-write flash memory; read-while-write/erase function; Costs; Flash memory; Frequency; Matrix converters; Memory architecture; Regulators; Silicon; Threshold voltage; Throughput; Voltage control;