• DocumentCode
    1668416
  • Title

    Defect detection of terminal lead by single stereo vision

  • Author

    Kusano, A. ; Watanabe, Toshio ; Funahashi, Takuma ; Koshimizu, Hiroyasu

  • Author_Institution
    Sch. of Inf. Sci. & Technol., Chukyo Univ., Toyota, Japan
  • fYear
    2013
  • Firstpage
    237
  • Lastpage
    241
  • Abstract
    Due to the miniaturization and complication of the size of electronic devices, it is recently required to maximize the inspection performance especially in precision. It is especially difficult to detect very small defects of the small electronic devices in size. In addition to these requirements, the performances of the inspection in cost and speed should be realized. For realizing these subjects of the inspection, image processing based on the silhouette and 3D images is promising. Especially, because the defect of terminal lead causes the failure of the solder on the printed circuit board, the defects on the terminal leads become fatal. Then we applied 3D images to the inspection of terminal lead for improving its performance in size. In this case we implemented a single camera 3D image acquisition system small enough for the real application to the production line.
  • Keywords
    automatic optical inspection; cameras; electron device manufacture; lead bonding; printed circuit manufacture; production engineering computing; soldering; stereo image processing; 3D images; electronic device size complication; electronic device size miniaturization; image processing; inspection performance; printed circuit board; production line; silhouette; single camera 3D image acquisition system; single stereo vision; solder failure; terminal lead defect detection; terminal lead inspection; Cameras; Feature extraction; Inspection; Mathematical model; Performance evaluation; Stereo vision; electoronic device; image sensing; quality control; stereo vision;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frontiers of Computer Vision, (FCV), 2013 19th Korea-Japan Joint Workshop on
  • Conference_Location
    Incheon
  • Print_ISBN
    978-1-4673-5620-6
  • Type

    conf

  • DOI
    10.1109/FCV.2013.6485495
  • Filename
    6485495