Title :
Recursive Learning: An attractive alternative to the decision tree for test generation in digital ci
Author :
Kunz, Wolfgang ; Pradhan, Dhiraj K.
Keywords :
Circuit faults; Circuit testing; Combinational circuits; Decision trees; Logic testing; Sequential analysis; Sequential circuits; Signal generators; Space exploration; System testing;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527905
