Title :
On the comparison of pseudo-random number generators for VLSI applications
Author :
Alabbdi, M.M. ; Alrumiah, Rumaih M. ; Adi, Majed
Author_Institution :
KACST/ECRI, Saudi Arabia
fDate :
6/20/1905 12:00:00 AM
Abstract :
Hortensius et al. have proposed a metric to compare pseudo-random number generators (PRNG) for VLSI applications. The metric is some form of a weighted average of the number sequences generated by the same PRNG that failed specific number of tests. In this paper, this proposed metric is more closely analyzed, and its pitfalls are high-lighted. The metric is then generalized, and a criterion is devised to compare PRNG´s for VLSI applications
Keywords :
VLSI; random number generation; Hortensius metric; VLSI; pseudo-random number generator; Autocorrelation; Automatic testing; Built-in self-test; Cryptography; Game theory; Lattices; Random number generation; Very large scale integration; Voting;
Conference_Titel :
Microelectronics, 1998. ICM '98. Proceedings of the Tenth International Conference on
Conference_Location :
Monastir
Print_ISBN :
0-7803-4969-5
DOI :
10.1109/ICM.1998.825614
