DocumentCode :
1668857
Title :
Fabrication of dimension-tunable Si nanopillar arrays with antireflection and self-cleaning properties
Author :
Lin, Yi-Ruei ; He, Jr-Hau
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2010
Firstpage :
515
Lastpage :
516
Abstract :
In the present work, the SWSs combining AR and enhanced hydrophobic effects was reported. A simple method, which combines sub-wavelength-scale monolayer spheres with a reactive ion etching process, to fabricate AR structures of Si nanorod arrays (NRAs) was used. Spectral reflectance measurements of Si substrates with NRA SWSs showed drastic reduction in reflection over a broad range of wavelengths and a wide range of angle of incidence, demonstrating its ability to broadband and omnidirectional antireflection. The reflectivity and the wettability as a function of diameter, height, of Si NWAs were discussed.
Keywords :
antireflection coatings; elemental semiconductors; hydrophobicity; nanofabrication; nanorods; reflectivity; silicon; sputter etching; substrates; surface cleaning; wetting; Si; Si nanorod arrays; Si substrates; broadband antireflection; dimension-tunable Si nanopillar arrays; hydrophobic effects; nanofabrication; omnidirectional antireflection; reactive ion etching; reflectivity; self-cleaning properties; spectral reflectance measurements; wettability; Coatings; Etching; Fabrication; Helium; Optical devices; Optical reflection; Optical surface waves; Optoelectronic devices; Reflectivity; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-3543-2
Electronic_ISBN :
978-1-4244-3544-9
Type :
conf
DOI :
10.1109/INEC.2010.5424973
Filename :
5424973
Link To Document :
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