DocumentCode
1668857
Title
Fabrication of dimension-tunable Si nanopillar arrays with antireflection and self-cleaning properties
Author
Lin, Yi-Ruei ; He, Jr-Hau
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear
2010
Firstpage
515
Lastpage
516
Abstract
In the present work, the SWSs combining AR and enhanced hydrophobic effects was reported. A simple method, which combines sub-wavelength-scale monolayer spheres with a reactive ion etching process, to fabricate AR structures of Si nanorod arrays (NRAs) was used. Spectral reflectance measurements of Si substrates with NRA SWSs showed drastic reduction in reflection over a broad range of wavelengths and a wide range of angle of incidence, demonstrating its ability to broadband and omnidirectional antireflection. The reflectivity and the wettability as a function of diameter, height, of Si NWAs were discussed.
Keywords
antireflection coatings; elemental semiconductors; hydrophobicity; nanofabrication; nanorods; reflectivity; silicon; sputter etching; substrates; surface cleaning; wetting; Si; Si nanorod arrays; Si substrates; broadband antireflection; dimension-tunable Si nanopillar arrays; hydrophobic effects; nanofabrication; omnidirectional antireflection; reactive ion etching; reflectivity; self-cleaning properties; spectral reflectance measurements; wettability; Coatings; Etching; Fabrication; Helium; Optical devices; Optical reflection; Optical surface waves; Optoelectronic devices; Reflectivity; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location
Hong Kong
Print_ISBN
978-1-4244-3543-2
Electronic_ISBN
978-1-4244-3544-9
Type
conf
DOI
10.1109/INEC.2010.5424973
Filename
5424973
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