• DocumentCode
    1668857
  • Title

    Fabrication of dimension-tunable Si nanopillar arrays with antireflection and self-cleaning properties

  • Author

    Lin, Yi-Ruei ; He, Jr-Hau

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2010
  • Firstpage
    515
  • Lastpage
    516
  • Abstract
    In the present work, the SWSs combining AR and enhanced hydrophobic effects was reported. A simple method, which combines sub-wavelength-scale monolayer spheres with a reactive ion etching process, to fabricate AR structures of Si nanorod arrays (NRAs) was used. Spectral reflectance measurements of Si substrates with NRA SWSs showed drastic reduction in reflection over a broad range of wavelengths and a wide range of angle of incidence, demonstrating its ability to broadband and omnidirectional antireflection. The reflectivity and the wettability as a function of diameter, height, of Si NWAs were discussed.
  • Keywords
    antireflection coatings; elemental semiconductors; hydrophobicity; nanofabrication; nanorods; reflectivity; silicon; sputter etching; substrates; surface cleaning; wetting; Si; Si nanorod arrays; Si substrates; broadband antireflection; dimension-tunable Si nanopillar arrays; hydrophobic effects; nanofabrication; omnidirectional antireflection; reactive ion etching; reflectivity; self-cleaning properties; spectral reflectance measurements; wettability; Coatings; Etching; Fabrication; Helium; Optical devices; Optical reflection; Optical surface waves; Optoelectronic devices; Reflectivity; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference (INEC), 2010 3rd International
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-3543-2
  • Electronic_ISBN
    978-1-4244-3544-9
  • Type

    conf

  • DOI
    10.1109/INEC.2010.5424973
  • Filename
    5424973