Title :
A novel approach to estimating the cell loss probability of an ATM multiplexer loaded with homogeneous bursty sources
Author :
Yang, Tao ; Tsang, Danny H K
Author_Institution :
Dept. of Electr. Eng., Tech. Univ. of Nova Scotia, Halifax, NS, Canada
Abstract :
The cell loss probability is determined in order to investigate the call admission control problem in an asynchronous transfer mode (ATM) multiplexer loaded with a superposition of M independent and homogeneous bursty sources. The system is modeled as a single-server queuing system with finite buffer space and a deterministic service rate. The arrival process is approximated by a Markov modulated deterministic process (MMDP) in which cells arrive at a uniform rate determined by an m-state Markov process. Two approximation methods based on the MMDP approach are proposed. The first leads to an efficient iterative algorithm for computing the system steady-state probabilities from which the cell loss probability can be calculated. The second provides a closed-form formula for the cell loss probability. Comparison with simulation results shows that the first method is remarkably accurate for all cases examined, whereas the closed-form formula is accurate for cases in which the average burst length is relatively large
Keywords :
Markov processes; asynchronous transfer mode; multiplexing equipment; probability; queueing theory; ATM multiplexer; MMDP; Markov modulated deterministic process; approximation methods; arrival process; asynchronous transfer mode; average burst length; call admission control; cell loss probability; closed-form formula; deterministic service rate; homogeneous bursty sources; iterative algorithm; simulation results; single-server queuing system; steady-state probabilities; Asynchronous transfer mode; Call admission control; Councils; Delay; Industrial engineering; Mathematics; Multiplexing; Probability; Statistics; Steady-state;
Conference_Titel :
Global Telecommunications Conference, 1992. Conference Record., GLOBECOM '92. Communication for Global Users., IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-0608-2
DOI :
10.1109/GLOCOM.1992.276554