• DocumentCode
    1669266
  • Title

    Advanced HF SiC MOS devices

  • Author

    Agarwal, Anant ; Callanan, Robert ; Das, Mrinal ; Hull, Brett ; Richmond, James ; Ryu, Sei-Hyung ; Palmour, John

  • Author_Institution
    CREE, INC., Durham, NC, USA
  • fYear
    2009
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    The characteristics of silicon carbide, 1200 V, 20 A MOSFETs have been described from a user´s perspective. DC and dynamic characteristics of SiC MOSFETs have been compared with Si 900 V super junction MOSFET (SJMOSFET), Si 1200 V MOSFET and IGBTs. The advantages of SiC MOSFET are their lower turn-off losses, lower conduction losses and lower gate charge. However, they have low output impedance, low transconductance and low threshold voltage. These factors should be taken into account when designing the gate drive and fault detection circuits. The use of the internal body diode is not recommended for SiC MOSFETs due to its high voltage drop and therefore considerations for choosing the rating of external SiC Schottky diode have been presented. The absence of turn-off current tail results in voltage overshoot and ringing and therefore careful minimization of parasitics in the gate drive and load circuits is required. Finally, the results of reliability tests on SiC MOSFETs have been summarized.
  • Keywords
    MOSFET circuits; Schottky diodes; insulated gate bipolar transistors; silicon compounds; HF SiC MOS devices; IGBT; MOSFET; Schottky diode; current 20 A; fault detection circuits; gate drive; silicon carbide; super junction MOSFET; voltage 1200 V; voltage 900 V; Circuits; Hafnium; Impedance; Insulated gate bipolar transistors; MOS devices; MOSFETs; Schottky diodes; Silicon carbide; Transconductance; Voltage; High temperature electronics; MOSFET; Power semiconductor device; Silicon Carbide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Applications, 2009. EPE '09. 13th European Conference on
  • Conference_Location
    Barcelona
  • Print_ISBN
    978-1-4244-4432-8
  • Electronic_ISBN
    978-90-75815-13-9
  • Type

    conf

  • Filename
    5279070