Title :
Concurrent bug patterns and how to test them
Author :
Farchi, Eitan ; Nir, Yarden ; Ur, Shmuel
Author_Institution :
Verification Technol. Dept., IBM Haifa Res. Lab., Israel
Abstract :
We present and categorize a taxonomy of concurrent bug patterns. We then use the taxonomy to create new timing heuristics for ConTest. Initial industrial experience indicates that these heuristics improve the bug finding ability of ConTest. We also show how concurrent bug patterns can be derived from concurrent design patterns. Further research is required to complete the concurrent bug taxonomy and formal experiments are needed to show that heuristics derived from the taxonomy improve the bug finding ability of ConTest.
Keywords :
multi-threading; object-oriented programming; program debugging; program testing; ConTest; bug finding ability; concurrent bug patterns; concurrent bug taxonomy; concurrent design patterns; heuristics; timing heuristics; Computer bugs; Computer languages; Interleaved codes; Java; Libraries; Sequential analysis; Software design; Taxonomy; Testing; Timing;
Conference_Titel :
Parallel and Distributed Processing Symposium, 2003. Proceedings. International
Print_ISBN :
0-7695-1926-1
DOI :
10.1109/IPDPS.2003.1213511
