• DocumentCode
    1669475
  • Title

    DRC-BASED SELECTION OF OPTIMAL PROBING POINTS FOR CMIP-INTERNAL MEASUREMENTS

  • Author

    Scharf, R. ; Kuntzsch, C. ; Helmreich, K. ; Wolz, W. ; Muller-Glaser, K.D.

  • fYear
    1992
  • Firstpage
    840
  • Keywords
    Area measurement; Circuit synthesis; Circuit testing; Crosstalk; Electron beams; Guidelines; Integrated circuit measurements; Passivation; Semiconductor device measurement; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527908
  • Filename
    527908
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1669475