DocumentCode :
1669590
Title :
Effect of annealing on magnetic properties of Ni80Fe20 permalloy nanoparticles with various sizes prepared by polyol method
Author :
Qin, G.W. ; Pei, W.L. ; Ren, Y.P. ; Shimada, Y. ; Endo, Y. ; Yamaguchi, M. ; Okamoto, S. ; Kitakami, O.
Author_Institution :
Key Lab. for Anisotropy & Texture of Mater. (MOE), Northeastern Univ., Shenyang, China
fYear :
2010
Firstpage :
1116
Lastpage :
1117
Abstract :
Ni80Fe20 permalloy nanoparticles (NPs) with narrow size distribution and homogeneous composition have been prepared by the polyol processing at 180°C for 2 h and their particle sizes can be tunable in the size range of 20~440 nm by proper addition of K2PtCl4 agent. X-ray diffraction results show that the NiFe NPs are of face centered cubic (FCC) structure. The addition of K2PtCl4 does not affect the composition of NiFe NPs but decreases the particle size remarkably. Both saturation magnetization and coercivity of the as-prepared NiFe NPs decrease with decreasing particle size. Annealed at 280°C, however, the saturation magnetization of various size NiFe nanoparticles increases drastically and approaches to the bulk for the ~440 nm NiFe particles, however, a maximum coercivity (~270 Oe) happens at a critical size of ~50 nm. The magnetic property dependency of these NiFe NPs on annealing has been discussed by considering the surface chemistry.
Keywords :
Permalloy; X-ray diffraction; annealing; magnetisation; nanoparticles; particle size; potassium compounds; surface chemistry; K2PtCl4; Ni80Fe20; X-ray diffraction; annealing; coercivity; face centered cubic structure; homogeneous composition; magnetic properties; particle size; permalloy nanoparticles; polyol method; saturation magnetization; size 20 nm to 440 nm; size distribution; surface chemistry; temperature 180 degC; temperature 280 degC; time 2 h; Annealing; Coercive force; FCC; Magnetic properties; Nanoparticles; Saturation magnetization; Size control; Solvents; X-ray diffraction; X-ray scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-3543-2
Electronic_ISBN :
978-1-4244-3544-9
Type :
conf
DOI :
10.1109/INEC.2010.5424998
Filename :
5424998
Link To Document :
بازگشت