Title :
Heavy Load Simulation Model of Flyback Switching DC-DC Converters and its Application for Reliability Improvement
Author :
Chen, Jiaxin ; Guo, Youguang ; Zhu, Jianguo ; Jin, Jianxun
Author_Institution :
Donghua Univ., Shanghai
Abstract :
This paper presents the simulation model of flyback switching DC-DC converters operating in heavy load modes, and the application of the model in the converter design for improving the system reliability. To derive the simulation model, different operational modes and atomic circuit blocks (ACB) are established first. Then, the state-machine of the system is studied. Finally, the transfer function of each ACB is determined, and according to the relationship among the ACBs, the complete simulation model is built, which can be used for transient analysis during starting, the operation in the under-voltage mode or over-current mode. Furthermore, the heavy load simulation model is applied to calculate the maximum steady-state power loss of the output diode, one of the key factors for thermal analysis which is crucial for the system reliability. The effect of time delay is also considered. By modifying the parameters of a physical flyback converter according to the simulation results, the converter reliability is significantly improved. The theoretical analysis is verified by experimental results.
Keywords :
DC-DC power convertors; delays; reliability; switching convertors; thermal analysis; transfer functions; transient analysis; atomic circuit blocks; flyback switching DC-DC converters; heavy load simulation model; starting operation; steady-state power loss calculation; system reliability; system state-machine; thermal analysis; time delay; transfer function; transient analysis; Analytical models; Circuit simulation; DC-DC power converters; Load modeling; Power system modeling; Reliability; Steady-state; Switching converters; Transfer functions; Transient analysis;
Conference_Titel :
Industry Applications Conference, 2007. 42nd IAS Annual Meeting. Conference Record of the 2007 IEEE
Conference_Location :
New Orleans, LA
Print_ISBN :
978-1-4244-1259-4
Electronic_ISBN :
0197-2618
DOI :
10.1109/07IAS.2007.347