DocumentCode :
1669870
Title :
A comparison study of field assisted electron emission from nanocluster carbon films grown using a continuous and a pulsed cathodic arc process
Author :
Satyanarayana, B.S.
Author_Institution :
Dept. of Electron. & Commun., Manipal Inst. of Technol., India
fYear :
2005
Firstpage :
314
Lastpage :
315
Abstract :
Field emission from nanoclustered carbon films grown using pulsed cathodic arc process is presented and compared with carbon films grown using continuous cathodic arc process. The samples exhibit relatively low field electron emission. However, films grown using pulsed arc process show slightly higher emission threshold compared to those grown using continuous cathodic arc process. This may be attributed to the difference in the energy kinetics of the arc initiation process. Raman measurements also show that films grown using continuous arc have better clusters and less amorphous phase leading to relatively more distinct G and D peaks compared to the broader G peak and shoulder indicating the D peak observed for films grown using a trigger less pulsed arc.
Keywords :
Raman spectra; carbon; electron field emission; nanostructured materials; thin films; C; D peak; G peak; Raman measurement; carbon films; continuous cathodic arc process; field assisted electron emission; nanocluster; pulsed cathodic arc process; Amorphous materials; Carbon dioxide; Carbon nanotubes; Diamond-like carbon; Electron emission; Nanostructured materials; Organic materials; Plasma materials processing; Plasma temperature; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference, 2005. IVNC 2005. Technical Digest of the 18th International
Print_ISBN :
0-7803-8397-4
Type :
conf
DOI :
10.1109/IVNC.2005.1619612
Filename :
1619612
Link To Document :
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