Title :
On the uniformity of field emission in screen printed CNT-cathodes: the effects of the cathode roughness
Author :
Liu, Weihua ; Zhu, Changchun ; Meng, Cao ; Zeng, Fanguang
Author_Institution :
Sch. of Electron. & Information Eng., Xi´´an Jiaotong Univ., China
Abstract :
The effects of the cathode roughness on the trace of the electron beams were given by numerical result for the first time. And some of the simulation results were confirmed in a testing device.
Keywords :
carbon nanotubes; cathodes; electron field emission; C; carbon nanotube; cathode roughness; electron beams; field emission; screen printed cathode; testing device; Cathodes; Costs; Degradation; Displays; Electron beams; Insulation; Microscopy; Rough surfaces; Surface roughness; Testing;
Conference_Titel :
Vacuum Nanoelectronics Conference, 2005. IVNC 2005. Technical Digest of the 18th International
Print_ISBN :
0-7803-8397-4
DOI :
10.1109/IVNC.2005.1619614
