DocumentCode
1669895
Title
On the uniformity of field emission in screen printed CNT-cathodes: the effects of the cathode roughness
Author
Liu, Weihua ; Zhu, Changchun ; Meng, Cao ; Zeng, Fanguang
Author_Institution
Sch. of Electron. & Information Eng., Xi´´an Jiaotong Univ., China
fYear
2005
Firstpage
318
Lastpage
319
Abstract
The effects of the cathode roughness on the trace of the electron beams were given by numerical result for the first time. And some of the simulation results were confirmed in a testing device.
Keywords
carbon nanotubes; cathodes; electron field emission; C; carbon nanotube; cathode roughness; electron beams; field emission; screen printed cathode; testing device; Cathodes; Costs; Degradation; Displays; Electron beams; Insulation; Microscopy; Rough surfaces; Surface roughness; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Nanoelectronics Conference, 2005. IVNC 2005. Technical Digest of the 18th International
Print_ISBN
0-7803-8397-4
Type
conf
DOI
10.1109/IVNC.2005.1619614
Filename
1619614
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