Title :
Investigations on growth and hydrogen gas sensing property of ZnO nanowires prepared by hydrothermal growth
Author :
Kim, Jung-Hyun ; Kang, Dong-Suk ; Hong, Soon-Ku ; Kim, Hyojin ; Kim, Dojin ; Lee, Jae Wook ; Lee, Jeong Yong
Author_Institution :
Dept. of Adv. Mater. Eng., Chungnam Nat. Univ., Daejeon, South Korea
Abstract :
Very narrow ZnO nanowires are synthesized on the sputtered ZnO seed layer by hydrothermal growth method. Varying the growth parameters we can obtain several features of ZnO nanowire. The nanowires with a diameter of about 15 nm and with a length longer than 5 ¿m are grown, which are much narrower than ZnO nanowires grown by chemical vapor deposition. The underlying ZnO seed layer enhanced the nucleation of ZnO nanowire during the followed ZnO synthesis by hydrothermal growth but without the seed layer, ZnO grown randomly as a rod shape. The molar ratio of the source is critical to the shape of the ZnO nanowire. Crystal orientation of ZnO nanowire is investigated by X-ray ¿-2¿ diffraction and microstructure of the ZnO nanowire is examined by transmission electron microscopy. Hydrogen-gas sensing property is measured and compared from the synthesized ZnO nanowires.
Keywords :
II-VI semiconductors; X-ray diffraction; chemical vapour deposition; crystal growth from solution; crystal microstructure; crystal orientation; gas sensors; hydrogen; nucleation; semiconductor quantum wires; transmission electron microscopy; wide band gap semiconductors; zinc compounds; X-ray ¿-2¿ diffraction; ZnO; chemical vapor deposition; crystal orientation; hydrogen gas sensing property; hydrothermal growth; microstructure; nanowires; nucleation; sputtered seed layer; transmission electron microscopy; Chemical vapor deposition; Hydrogen; Materials science and technology; Mercury (metals); Molecular beam epitaxial growth; Nanowires; Shape; Temperature; Water; Zinc oxide;
Conference_Titel :
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-3543-2
Electronic_ISBN :
978-1-4244-3544-9
DOI :
10.1109/INEC.2010.5425010