• DocumentCode
    1670078
  • Title

    Alternative field electron emission characteristics from graphite-insulator composite layers

  • Author

    Waite, M.S. ; Bishop, H.E. ; Brierly, M. ; Tuck, R.A. ; Taylor, W.

  • Author_Institution
    MIMIV Ltd, Hartlepool
  • fYear
    2004
  • Firstpage
    332
  • Lastpage
    333
  • Abstract
    A novel type of emitter for a FED, the pFED is being developed for the past ten years. This emitter is formed from micron-sized silica coated with a nano-scale silica insulator. Of the commercially available graphites tested, the best performance was obtained from a 6 mum grade material. When printing such a material a coverage of ~15% cannot be exceeded without forming large clusters that disrupt subsequent processing, thus limiting the density of potential emission sites. In addition, many flakes lie flat on the surface and are unlikely to contribute to emission. In order to improve the density of emitters a thick ink approach has been investigated where the flakes are supported in a mixture of nanoparticle silica (or other insulating particles such as TiO2 or Al2O3) and submicron graphite. The resulting structure is some 1-2 mum thick with the graphite flakes and the underlying cathode connected by a semi-resistive pathway of conducting and insulating particles. The emission properties of these thick inks were comparable with those of the thin inks except that in some cases a second type of emission (Type II emission) was observed
  • Keywords
    cathodes; electron field emission; graphite; insulating materials; nanocomposites; nanoparticles; silicon compounds; Type II emission; alternative field electron emission characteristics; cathode; cluster formation; conducting particles; coverage; emission properties; emission site density; emitter density; graphite flakes; graphite-insulator composite layers; insulating particles; micron-sized silica; nanoparticle; nanoscale silica insulator; pFED; printing; semiresistive pathway; thick ink approach; thin inks; Anodes; Automatic testing; Bars; Dielectrics and electrical insulation; Diodes; Electron beams; Electron emission; Ink; Materials testing; Silicon compounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2005. IVNC 2005. Technical Digest of the 18th International
  • Conference_Location
    Oxford
  • Print_ISBN
    0-7803-8397-4
  • Type

    conf

  • DOI
    10.1109/IVNC.2005.1619621
  • Filename
    1619621