• DocumentCode
    1670226
  • Title

    Ferroelectric domain and d33 measurement in the BiPbFeO3 film

  • Author

    Huang, Yu-Kuan ; Yu, Chin-Chung ; Chou, Hsiung

  • Author_Institution
    Dept. of Appl. Phys., Nat. Univ. of Kaohsiung, Kaohsiung, Taiwan
  • fYear
    2010
  • Firstpage
    531
  • Lastpage
    532
  • Abstract
    The as-grown ferroelectric domain of the BiPbFeO3 film is characterized by the vertical and lateral piezoresponse force microscope. A stripe domain with cross structure resulted by the spontaneous polarization along the [111] directions of BiPbFeO3 film is observed. The vertical piezoresponse signal, polarization versus voltage curve, is obtained. Based on the amplitude hysteresis curve, the d33 coefficient of the 300 nm-thick BiPbFeO3 film is obtained with a value of around 30.47 pm/V.
  • Keywords
    bismuth compounds; dielectric hysteresis; dielectric polarisation; electric domains; ferroelectric thin films; lead compounds; BiPbFeO3; [111] directions; amplitude hysteresis curve; d33 measurement; ferroelectric domain; film; piezoresponse force microscope; polarization versus voltage curve; size 300 nm; spontaneous polarization; stripe domain; vertical piezoresponse signal; Atomic force microscopy; Ferroelectric films; Ferroelectric materials; Force measurement; Nonvolatile memory; Physics; Polarization; Sputtering; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference (INEC), 2010 3rd International
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-3543-2
  • Electronic_ISBN
    978-1-4244-3544-9
  • Type

    conf

  • DOI
    10.1109/INEC.2010.5425021
  • Filename
    5425021
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1670226