Title :
Automatic Test Program Generation for Mixed Signal ICs via Design To Test Link
Author :
Kao, William ; Xia, Jean ; Boydston, Tom
Keywords :
Automatic test pattern generation; Automatic testing; Computer aided engineering; Design engineering; Life testing; Rivers; Signal design; Signal generators; System testing; Test pattern generators;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527911
