• DocumentCode
    1670283
  • Title

    Automatic Test Program Generation for Mixed Signal ICs via Design To Test Link

  • Author

    Kao, William ; Xia, Jean ; Boydston, Tom

  • fYear
    1992
  • Firstpage
    860
  • Keywords
    Automatic test pattern generation; Automatic testing; Computer aided engineering; Design engineering; Life testing; Rivers; Signal design; Signal generators; System testing; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527911
  • Filename
    527911
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1670283