DocumentCode :
1670304
Title :
Electronic structure, electron field emission and magnetic behaviors of Carbon nanotube fabricated on La0.66Sr0.33MnO3 (LSMO) base layer
Author :
Ray, S.C. ; Wu, S.L. ; Tsai, M.-H. ; Okpalugo, T.I.T. ; Ling, D.C. ; Pong, W.F.
Author_Institution :
Sch. of Phys., Univ. of the Witwatersrand, Johannesburg, South Africa
fYear :
2010
Firstpage :
1076
Lastpage :
1077
Abstract :
This work elucidates the electronic structure, electron field emission and magnetic behaviors of carbon nanotube (CNT) fabricated without catalyst by the dip deposition method on the La0.66Sr0.33MnO3 (LSMO) as base layer. X-ray absorption near edge spectroscopy (XANES), valence band spectroscopy (VBPES) and Raman spectroscopy were used for the study of electronic properties; whereas the magnetization (M) was measured versus applied magnetic field strength (H), using a commercial physics properties measurement system (PPMS) at a temperatures range between 5 K and 305 K. In addition the electron field emission characteristics were performed using the instrument Keithley Model 237 with a power supply.
Keywords :
Raman spectra; XANES; carbon nanotubes; electron field emission; lanthanum compounds; magnetisation; nanofabrication; strontium compounds; valence bands; C; LSMO base layer; La0.66Sr0.33MnO3; Raman spectroscopy; X-ray absorption near edge spectroscopy; XANES; applied magnetic field strength; carbon nanotube; commercial physics property measurement system; dip deposition method; electron field emission; electronic structure; instrument Keithley Model 237; magnetization; temperature 5 K to 305 K; valence band spectroscopy; Carbon nanotubes; Electromagnetic wave absorption; Electron emission; Magnetic field measurement; Magnetic properties; Magnetization; Power measurement; Raman scattering; Spectroscopy; Strontium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-3543-2
Electronic_ISBN :
978-1-4244-3544-9
Type :
conf
DOI :
10.1109/INEC.2010.5425022
Filename :
5425022
Link To Document :
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