Title :
Improving Total IC Design Quality using Application Mode Testing
Author :
Mehtani, R. ; deJonghe, M. ; Morren, R. ; Baker, K.
Keywords :
Animation; Application specific integrated circuits; Data engineering; Design engineering; Digital signal processing; Integrated circuit testing; Laboratories; Process design; System testing; Systems engineering and theory;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527912
