Title :
TSV model linearization
Author :
Salah, Khaled ; Rouby, A.E. ; Ragai, Hani ; Ismail, Yehea
Author_Institution :
Mentor Graphics, Cairo, Egypt
Abstract :
This paper presents a SPICE-friendly linear model for the nonlinear TSV depletion capacitance and resistance, where a single nonlinear dependent element is approximated by a number of linear independent elements. The voltage-dependent depletion capacitor is modeled using a constant capacitor and a voltage controlled voltage source and the voltage-dependent depletion resistance is modeled using a constant resistance and a current controlled voltage source. This makes the model compatible with SPICE simulator. The proposed linear model is verified against the nonlinear one and it shows a good agreement.
Keywords :
capacitors; electric current control; integrated circuit modelling; three-dimensional integrated circuits; SPICE-friendly linear model simulator; TSV model linearization; constant resistance; current controlled voltage source; linear independent element approximation; nonlinear TSV depletion capacitance; nonlinear TSV depletion resistance; single nonlinear dependent element; voltage controlled voltage source; voltage-dependent depletion capacitor; voltage-dependent depletion resistance; Capacitance; Integrated circuit modeling; Mathematical model; Resistance; Three dimensional displays; Through-silicon vias; Voltage control; Depletion; Linearization; Lumped Model; RLC; TSV; Three-Dimensional ICs; Through Silicon Via;
Conference_Titel :
Microelectronics (ICM), 2011 International Conference on
Conference_Location :
Hammamet
Print_ISBN :
978-1-4577-2207-3
DOI :
10.1109/ICM.2011.6177394
