Title :
The fourth generation 3GPP LTE identification for cognitive radio
Author :
Alyaoui, Nouha ; Kachouri, Abdennaceur ; Samet, Mounir
Author_Institution :
Electron. Labs. of Technol.´´s Inf., (L.E.T.I), Nat. Eng. Sch. of Sfax, Sfax, Tunisia
Abstract :
The recent evolution of digital communication systems (voice, data and video) has been dramatic. The 3GPP Long Term Evolution (LTE) system is one of the latest developments in wireless telecommunications. This system deploy Orthogonal Frequency Division Multiplexing (OFDM) physical layer consisting of large number of mutually orthogonal sub carriers. This characteristic provides high robustness against multi-path effects. In this paper, we discuss the 3GPP/LTE recognition for cognitive radio. Specifically, two algorithms are addressed: the Pilot Induced Cyclostationarity (PIC) and Gaussian Maximum Likelihood (GML). The robustness of these algorithms is tested against noise power and changes in noise model. Additive White Gaussian Noise (AWGN) and Bi-Kappa noise models are considered in this work.
Keywords :
3G mobile communication; 4G mobile communication; AWGN; Long Term Evolution; OFDM modulation; cognitive radio; 3GPP-LTE recognition; AWGN model; Bi-Kappa noise model; GML algorithm; Gaussian maximum likelihood algorithm; OFDM physical layer; PIC; additive white Gaussian noise model; cognitive radio; digital communication system; fourth generation 3GPP LTE identification system; fourth generation 3GPP Long Term Evolution identification system; multipath effect; mutually orthogonal subcarrier; orthogonal frequency division multiplexing physical layer; pilot induced cyclostationarity; wireless telecommunication; Classification algorithms; Cognitive radio; Conferences; Modulation; Noise; OFDM; Receivers; 3GPP LTE identification; Cognitive radio; Gaussian Maximum Likelihood; Pilot induced cyclostationarity; Probability of correct classification;
Conference_Titel :
Microelectronics (ICM), 2011 International Conference on
Conference_Location :
Hammamet
Print_ISBN :
978-1-4577-2207-3
DOI :
10.1109/ICM.2011.6177396
