Title :
Low cost test for catastrophic faults in CMOS operational transcondutor
Author :
Fouad, Mahmoud M. ; Amer, Hassanein H. ; Madian, Ahmed H. ; Abdelhalim, M.B.
Author_Institution :
Electron. & Commun. Dept., Cairo Univ., Cairo, Egypt
Abstract :
In this paper, a test is developed for the Operational Transconductor (OTA). The technology used is the 90nm CMOS technology. The assumed fault model consists of six faults per transistor including the open-gate fault. It is proven that only two test values are enough to detect 34 of the possible 36 faults, i.e., a coverage of 94.4%. A Monte Carlo analysis is then performed to study the effect, on test coverage, of changing the value of the resistive short in the fault model. It is found that the same two test values still guarantee 94.4% coverage irrespective of the value of the short.
Keywords :
CMOS analogue integrated circuits; Monte Carlo methods; integrated circuit testing; operational amplifiers; CMOS operational transcondutor; Monte Carlo analysis; catastrophic fault; low cost testing; open-gate fault; size 90 nm; CMOS integrated circuits; Circuit faults; Integrated circuit modeling; Logic gates; Resistance; Testing; Transistors; Analog Testing; CMOS; Transcondcutor; fault model; minimum test;
Conference_Titel :
Microelectronics (ICM), 2011 International Conference on
Conference_Location :
Hammamet
Print_ISBN :
978-1-4577-2207-3
DOI :
10.1109/ICM.2011.6177397
