Title :
A fully integrated CMOS Hall sensor with a 3.65 μT 3σ offset for compass applications
Author :
Van der Meer, Jeroen C. ; Riedijk, Frank R. ; Van Kampen, Edward ; Makinwa, Kofi A A ; Huijsing, Johan H.
Author_Institution :
Xensor Integration, Delft, Netherlands
Abstract :
A fully-integrated CMOS Hall sensor suitable for use in compass applications has a 3σ offset spread less than 4.5 μT. After artificial aging it drifts less than 250 nT. Using two such sensors, a fully integrated electronically calibrated compass with a stability of 0.5° is realized. The sensor has an analog PWM and a digital RS232/SPI/μwire interface.
Keywords :
CMOS integrated circuits; Hall effect transducers; ageing; circuit stability; compasses; electric sensing devices; integrated circuit measurement; magnetic sensors; magnetic variables measurement; navigation; pulse width modulation; artificial aging; compass applications; digital RS232/SPI/μwire interface; electronically calibrated compass stability; fully integrated CMOS Hall sensor; offset spread; sensor analog PWM; sensor drift; CMOS process; CMOS technology; Choppers; Dynamic range; Filtering; Magnetic sensors; Magnetic separation; Pulse width modulation; Switches; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 2005. Digest of Technical Papers. ISSCC. 2005 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-8904-2
DOI :
10.1109/ISSCC.2005.1493961
