A fully integrated CMOS Hall sensor with a 3.65 μT 3σ offset for compass applications

Author

Van der Meer, Jeroen C. ; Riedijk, Frank R. ; Van Kampen, Edward ; Makinwa, Kofi A A ; Huijsing, Johan H.

Author_Institution

Xensor Integration, Delft, Netherlands

fYear

2005

Firstpage

246

Abstract

A fully-integrated CMOS Hall sensor suitable for use in compass applications has a 3σ offset spread less than 4.5 μT. After artificial aging it drifts less than 250 nT. Using two such sensors, a fully integrated electronically calibrated compass with a stability of 0.5° is realized. The sensor has an analog PWM and a digital RS232/SPI/μwire interface.

Keywords

CMOS integrated circuits; Hall effect transducers; ageing; circuit stability; compasses; electric sensing devices; integrated circuit measurement; magnetic sensors; magnetic variables measurement; navigation; pulse width modulation; artificial aging; compass applications; digital RS232/SPI/μwire interface; electronically calibrated compass stability; fully integrated CMOS Hall sensor; offset spread; sensor analog PWM; sensor drift; CMOS process; CMOS technology; Choppers; Dynamic range; Filtering; Magnetic sensors; Magnetic separation; Pulse width modulation; Switches; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference, 2005. Digest of Technical Papers. ISSCC. 2005 IEEE International

Conference_Location

San Francisco, CA

ISSN

0193-6530

Print_ISBN

0-7803-8904-2

Type

conf

DOI

10.1109/ISSCC.2005.1493961

Filename

1493961