Title :
CIRCUIT DESIGN FOR BUILT-IN CURRENT TESTING
Author :
Miura, Yukiya ; Kinoshita, Kozo
Keywords :
Circuit faults; Circuit synthesis; Circuit testing; Clocks; Current measurement; Electrical fault detection; Integrated circuit testing; Test equipment; Time measurement; Velocity measurement;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527913
