Unique One-Probe method and instruments for “instant In-Circuit measurement of quality of capacitors” physical base of the Method - Infinitely Remote Point conception

Unlike the well-known In-Circuit methods, based on passing the probing current through the Meter-first probe-first terminal of the capacitor, and plate-dielectric-plate-second terminal of capacitor-second probe of the meter the new Method is based on the principally new approach. The probing current flows through the following circuit: Meter-the probe-envelop of capacitor-internal content-any terminal-conducting environment of the terminal. Physical base and appropriate equations were set forth in USA Patent 6, 198,290, March 2001. There is no second probe. The probing current is formed due to polarization of conducting environment associated with the terminal of the capacitor as well as displacement currents. The development of physical base of the Method originated by the Method of “Infinitely Remote Point”. The Method and instruments were successfully tested at NASA testing facility in summer of 2001.