Title :
High frequency input impedance characterization of dielectric films for power-ground planes
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fDate :
6/24/1905 12:00:00 AM
Abstract :
Broadband impedance characterization of high-k films was performed in the frequency range of 100 MHz to 10 GHz using a coaxial test fixture configuration. The electrical characteristic of high-k films was found to be consistent with a capacitance load, without noticeable contribution from the circuit inductance that typically dominates the high frequency response. An intrinsic high frequency relaxation process was analyzed in high-k organic-ceramic hybrid materials. The resulting dielectric dispersion and the corresponding dielectric loss can suppress the resonant standing waves in power-ground planes.
Keywords :
dielectric losses; dielectric measurement; dielectric relaxation; dielectric thin films; electric impedance measurement; permittivity; 100 MHz to 10 GHz; broadband measurement; capacitance load; circuit inductance; coaxial test fixture; decoupling capacitance; dielectric dispersion; dielectric loss; dielectric relaxation; electrical characteristics; high-frequency input impedance; high-k dielectric film; organic-ceramic hybrid material; power-ground plane; resonant standing wave; Circuit testing; Coaxial components; Dielectric films; Dielectric losses; Fixtures; Frequency; High K dielectric materials; High-K gate dielectrics; Impedance; Performance evaluation;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2002. IMTC/2002. Proceedings of the 19th IEEE
Print_ISBN :
0-7803-7218-2
DOI :
10.1109/IMTC.2002.1007151