Generalised calibration schemes for precision RF vector network analyser measurements

Author

Morgan, A.G. ; Ridler, N.M. ; Salter, M.J.

Author_Institution

Nat. Phys. Lab., UK

Volume

2

fYear

2002

fDate

6/24/1905 12:00:00 AM

Firstpage

1355

Abstract

This paper discusses RF calibration schemes for one-port vector network analysers other than the traditional short-open-load scheme. Before use, the calibration standards are characterised by fitting polynomials to measured voltage reflection coefficient values. Simulated uncertainty profiles and examples of measurement uncertainties obtained for various calibration schemes are presented. A method of adaptively choosing the best calibration scheme for a particular device at a particular frequency is suggested.

Keywords

calibration; electric impedance measurement; electromagnetic wave reflection; measurement uncertainty; network analysers; standards; RF impedance; adaptive calibration scheme choice; calibration device; calibration frequency; characterised calibration standards; measurement uncertainties; network analyser generalised calibration schemes; one-port vector network analysers; polynomial fitting; precision RF vector network analyser measurements; reflectometry; short-open-load calibration schemes; uncertainty profiles; voltage reflection coefficient measurement; Calibration; Electrical resistance measurement; Frequency measurement; Impedance measurement; Measurement standards; Polynomials; Radio frequency; Transmission line measurements; Uncertainty; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2002. IMTC/2002. Proceedings of the 19th IEEE

ISSN

1091-5281

Print_ISBN

0-7803-7218-2

Type

conf

DOI

10.1109/IMTC.2002.1007154

Filename

1007154