Title :
Transient measurement of laser wakefield at the SILEX-I: Ti: Sapphire laser
Author :
Dong, Jun ; Peng, Zhi-tao ; Lu, Zhong-gui ; Sun, Zhi-hong ; Wang, Xiao-dong ; Su, Jing-qin ; Xie, Na ; Xia, Yan-wen ; Guo, Yi ; Sun, Li ; Wu, Yu-chi ; Zhu, Bin ; Tang, Jun ; Liu, Hua ; Yuan, Hao-yu
Author_Institution :
Res. Center of Laser Fusion, CAEP, Mianyang, China
Abstract :
Based on single-shot spectral interferometry, transient measuring technology of laser wakefield at the SILEX-I: Ti: Sapphire Laser is developed. The wakefield is captured with ~140 fs resolution over a temporal region of 1 ps.
Keywords :
laser beam effects; laser variables measurement; light interferometry; sapphire; solid lasers; titanium; wakefield accelerators; Al2O3:Ti; laser wakefield; single shot spectral interferometry; solid laser; transient measurement; Chirp; Frequency domain analysis; Laser beams; Laser excitation; Measurement by laser beam; Probes; Transient analysis;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2012 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1839-6
