1671146

Non-conventional faults in BiCMOS digital circuits

Ma, Siyad C. ; McCluskey, Edward J.

1995

882

BiCMOS integrated circuits; Bipolar transistors; CMOS logic circuits; Circuit faults; Circuit simulation; Circuit testing; Delay; Digital circuits; Fault diagnosis; Semiconductor device modeling;

English

ieee

Test Conference, 1992. Proceedings., International

Baltimore, MD

1089-3539

0-7803-0760-7

conf

10.1109/TEST.1992.527914

527914