• DocumentCode
    1671187
  • Title

    Automatic Removal of Ocular Artifacts from Electroencephalogram Using Hilbert-Huang Transform

  • Author

    Wang, Yan Long ; Liu, Jin Hua ; Liu, Yuan Chun

  • Author_Institution
    Dept. of Electr. & Inf. Eng., Zhe Jiang Inst. of Commun. & Media, Hangzhou
  • fYear
    2008
  • Firstpage
    2138
  • Lastpage
    2141
  • Abstract
    Hilbert-Huang transform (HHT) is a time-frequency analysis method, which extract intrinsic mode functions (IMFs) that admit well-behaved Hilbert transforms from the analyzed signals using empirical mode decomposition. With the Hilbert transform, the IMF yields meaningful instantaneous frequencies as functions of time. This paper presents a signal processing technique for automatic removal of ocular artifacts from Electroencephalogram (EEG) based on HHT. First, EEG contaminated by ocular artifacts was decomposed IMFs. Then the instantaneous frequencies of each IMF were computed respectively. If all instantaneous frequencies of an IMF are less than 3 Hz, then the value of the IMF is set to zero. If all instantaneous frequencies of an IMF are less than 16 Hz, then the value of IMF, which is greater than a threshold, is set to zero. Computing the sum of all IMFs having been processed, we can obtain corrected EEG. The experimental results show that this method, which remove most ocular artifacts in EEG and distort EEG slightly, is effective.
  • Keywords
    electroencephalography; medical signal processing; time-frequency analysis; Hilbert-Huang transform; electroencephalogram; empirical mode decomposition; extract intrinsic mode functions; instantaneous frequency; ocular artifacts; signal processing; time-frequency analysis method; Adaptive filters; Brain; Data mining; Electroencephalography; Electrooculography; Eyes; Independent component analysis; Inspection; Signal processing; Time frequency analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bioinformatics and Biomedical Engineering, 2008. ICBBE 2008. The 2nd International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1747-6
  • Electronic_ISBN
    978-1-4244-1748-3
  • Type

    conf

  • DOI
    10.1109/ICBBE.2008.864
  • Filename
    4535744