Title :
The X-ray emission from 2 kJ plasma focus and application as a backlighter
Author :
Beg, F.N. ; Dangor, A.E. ; Ross, I.
Author_Institution :
Blackett Lab., Imperial Coll. of Sci., Technol. & Med., London, UK
Abstract :
Summary form only given, as follows. Experiments were performed to characterize the X-ray emission from a small 2 kJ, 200 kA ´micro´ plasma focus. In deuterium, nitrogen, and neon discharges, the plasma focus produced a pinched plasma column, whereas in argon and xenon discharges, the focus was in the form of a series of bright spots. In these observations, the gas pressure was adjusted to give collapse at current maximum. The optimum X-ray emission of 70 J was obtained in neon discharges with a 5 cm length anode. Spectrally resolved observations show that the neon emission is mainly due to helium like 1s/sup 2/-2s2p transitions. To assess the plasma focus for X-ray backlighter applications, a wire mesh positioned 30 cm from the focus was backlit and a pinhole camera (100 m diameter) was used to image the mesh with a magnification of 2. Backlit images of carbon, aluminium and tungsten wire pinches powered by a 150 kA current generator will be presented.
Keywords :
X-ray production; discharges (electric); pinch effect; plasma focus; 150 kA; 2 kJ; 200 kA; 70 J; Al; Al wire pinch; Ar; Ar discharges; C; C wire pinch; D/sub 2/; D/sub 2/ discharges; N/sub 2/; N/sub 2/ discharges; Ne; Ne discharges; W; W wire pinch; X-ray backlighter; X-ray emission; Xe; Xe discharges; current generator; micro plasma focus; pinched plasma column; pinhole camera; Anodes; Argon; Deuterium; Focusing; Helium; Nitrogen; Plasma applications; Plasma x-ray sources; Wire; Xenon;
Conference_Titel :
Plasma Science, 1998. 25th Anniversary. IEEE Conference Record - Abstracts. 1998 IEEE International on
Conference_Location :
Raleigh, NC, USA
Print_ISBN :
0-7803-4792-7
DOI :
10.1109/PLASMA.1998.677948