Title :
Session 18 overview - high-speed interconnects and building blocks
Author :
Gutnik, Vadim ; Green, Michael
Keywords :
BiCMOS integrated circuits; CMOS process; CMOS technology; Circuit testing; Equalizers; Finite impulse response filter; Integrated circuit interconnections; Monitoring; Optical buffering; Optical fibers;
Conference_Titel :
Solid-State Circuits Conference, 2005. Digest of Technical Papers. ISSCC. 2005 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-8904-2
DOI :
10.1109/ISSCC.2005.1494001
