DocumentCode :
1672146
Title :
Fabrication of proton conducting Y2O3-doped BaZrO3 thin films by electrostatic spray deposition
Author :
Somroop, K. ; Pornprasertsuk, R.
Author_Institution :
Dept. of Mater. Sci., Chulalongkorn Univ., Bangkok, Thailand
fYear :
2010
Firstpage :
974
Lastpage :
975
Abstract :
Y2O3-doped BaZrO3 (BYZ) thin films were deposited by electrostatic spray deposition (ESD) technique. The effects of substrate temperature, precursor solution, flow rate, nozzle to substrate distance, voltage, and deposition time on the quality of the films have been studied. The microstructure, phase, and proton conductivities of the deposited BYZ thin films has been characterized by scanning electron microscopy (SEM), X-ray diffraction (XRD), and electrochemical impedance spectroscopy technique, respectively. The result has showed that ESD is an effective technique for thin film fabrications in both nano- and micro-scale electrochemical device.
Keywords :
X-ray diffraction; barium compounds; crystal microstructure; electrochemical impedance spectroscopy; nanofabrication; scanning electron microscopy; semiconductor thin films; substrates; yttrium compounds; zirconium compounds; BaZrO3:Y2O3; X-ray diffraction; electrochemical impedance spectroscopy; electrostatic spray deposition; flow rate; microstructure; precursor solution; proton conducting thin films; proton conductivity; scanning electron microscopy; substrate temperature; Electrostatic discharge; Fabrication; Microstructure; Protons; Scanning electron microscopy; Spraying; Sputtering; Substrates; Temperature; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-3543-2
Electronic_ISBN :
978-1-4244-3544-9
Type :
conf
DOI :
10.1109/INEC.2010.5425088
Filename :
5425088
Link To Document :
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