• DocumentCode
    1672146
  • Title

    Fabrication of proton conducting Y2O3-doped BaZrO3 thin films by electrostatic spray deposition

  • Author

    Somroop, K. ; Pornprasertsuk, R.

  • Author_Institution
    Dept. of Mater. Sci., Chulalongkorn Univ., Bangkok, Thailand
  • fYear
    2010
  • Firstpage
    974
  • Lastpage
    975
  • Abstract
    Y2O3-doped BaZrO3 (BYZ) thin films were deposited by electrostatic spray deposition (ESD) technique. The effects of substrate temperature, precursor solution, flow rate, nozzle to substrate distance, voltage, and deposition time on the quality of the films have been studied. The microstructure, phase, and proton conductivities of the deposited BYZ thin films has been characterized by scanning electron microscopy (SEM), X-ray diffraction (XRD), and electrochemical impedance spectroscopy technique, respectively. The result has showed that ESD is an effective technique for thin film fabrications in both nano- and micro-scale electrochemical device.
  • Keywords
    X-ray diffraction; barium compounds; crystal microstructure; electrochemical impedance spectroscopy; nanofabrication; scanning electron microscopy; semiconductor thin films; substrates; yttrium compounds; zirconium compounds; BaZrO3:Y2O3; X-ray diffraction; electrochemical impedance spectroscopy; electrostatic spray deposition; flow rate; microstructure; precursor solution; proton conducting thin films; proton conductivity; scanning electron microscopy; substrate temperature; Electrostatic discharge; Fabrication; Microstructure; Protons; Scanning electron microscopy; Spraying; Sputtering; Substrates; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference (INEC), 2010 3rd International
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-3543-2
  • Electronic_ISBN
    978-1-4244-3544-9
  • Type

    conf

  • DOI
    10.1109/INEC.2010.5425088
  • Filename
    5425088