Title :
Analog Circuits Fault Diagnosis Using Support Vector Machine
Author :
Sun, Yongkui ; Chen, Guangju ; Li, Hui
Author_Institution :
Univ. of Electron. Sci. & Technol. of China, Chengdu
Abstract :
Support vector machine (SVM) is a machine learning algorithm based on statistical theory, which has advantages of simple structure and strong generalization ability as well as classification ability to a few samples. A new method of analog circuit fault diagnosis based SVM is presented in this paper. The method of circuit fault signatures selection is introduced and the model of analog circuit fault based SVM is obtained. The simulation results of a biquadratic filter testified that the proposed approach for analog circuit fault diagnosis is superior to conventional ones and is to increase the fault diagnosis accuracy.
Keywords :
analogue circuits; biquadratic filters; circuit analysis computing; fault diagnosis; learning (artificial intelligence); statistical analysis; support vector machines; analog circuits fault diagnosis; biquadratic filter; circuit fault signatures selection; classification; generalization; machine learning; statistical theory; support vector machine; Analog circuits; Artificial neural networks; Automation; Circuit faults; Circuit testing; Fault diagnosis; Machine learning; Neural networks; Support vector machine classification; Support vector machines;
Conference_Titel :
Communications, Circuits and Systems, 2007. ICCCAS 2007. International Conference on
Conference_Location :
Kokura
Print_ISBN :
978-1-4244-1473-4
DOI :
10.1109/ICCCAS.2007.4348216