Title :
The Design of RFID Testing Channel Based on Direct Digital Synthesis Chip
Author :
Ying-Zheng, Hong ; Wei, Chen
Author_Institution :
Minist. of Public Security Shanghai, Shanghai
Abstract :
In recent years, radio frequency identification (RFID) technology has been widely used in many fields. Thus, how to reduce the price of testing RFID chip become a key problem which must be considered by chip manufacturer and test equipment supplier now. As an important part of carrier generator, direct digital synthesis chip play a key role in RFID testing system. In the paper, a new and economical design of RFID testing channel based on direct digital synthesis chip is discussed.
Keywords :
direct digital synthesis; integrated circuit testing; radiofrequency identification; system-on-chip; RFID chip testing; RFID testing channel; carrier generator; direct digital synthesis chip; radio frequency identification; Automatic testing; Circuit testing; Clocks; Fires; Frequency shift keying; Frequency synthesizers; PROM; Radiofrequency identification; Signal synthesis; System testing;
Conference_Titel :
Communications, Circuits and Systems, 2007. ICCCAS 2007. International Conference on
Conference_Location :
Kokura
Print_ISBN :
978-1-4244-1473-4
DOI :
10.1109/ICCCAS.2007.4348230
